Original Article |
2002, Vol.24, No.2, pp. 305-310
Magnetoresistance due to the Lorentz force in silicon membrane
Chitnarong Sirisathitkul, Haruthai Longkullabutra, Praiwan Kirdtongmee, Said Aslam, and John Gregg
pp. 305 - 310
Abstract
The Lorentz force gives rise to helical paths of moving charged particles in a magnetic field and these, in turn, result in reduction of mean free paths and higher scattering rates. This effect may be observed from magnetoresistance in a 1-µm thick silicon membrane. With a transverse current, the electrical resistance of the p-type silicon increases by 0.4% in a 1.6-tesla magnetic field at room temperature. The magnetoresistance increases to 1% at 250K. The plot of electrical resistance versus magnetic field can be approximated as a parabola and the hole mobility may be determined as 405 cm2/Vs at 290K and 610 cm2/Vs at 250 K.