Yongyut Laosiritaworn

pp. 1273 - 1284

Abstract

In this work, the magnetic properties of Ising thin-films were investigated as a function of temperature and thickness by means of mean-field calculation. The magnetization and the magnetic susceptibility
profiles, including layer variation, were investigated in detail. From the results, the magnetic behavior was
found changing from a two-dimensional to a three-dimensional character with increasing the film thickness.
In addition, the critical temperatures were calculated and a similar trend was found. The shift of the critical
temperatures from a two-dimensional to a bulk value was in good agreement with previous theoretical
prediction. This indicates the dimensional crossover of the magnetic critical behavior from thin-films to bulk
limit when the films become thick.