Saengla Chaimongkol, Fred W. Huffer, and Akihito Kamata

pp. 449 - 458

Abstract

This study proposed a multilevel logistic regression model to evaluate a source of DIF. The model accounts for the three levels nested structure of the data and combines results of logistic regression analyses to identify level-3 unit characteristic variables that explain a DIF variation. A simulation study is presented to assess the adequacy of the proposed models. The parameters of the proposed models were estimated by using a Bayesian approach implemented by the WinBUGS 1.4.